Hosmer, David W. | Sturdivant, Rodney X. | Lemeshow, Stanley Applied Logistic Regression 2013 - John Wiley et Sons Ltd.
Hosmer, David W. | Sturdivant, Rodney X. | Lemeshow, Stanley Applied Logistic Regression 2013 - John Wiley et Sons Ltd. 1108626 characters. Información ISBN: 9781118548356 Permalink: http://digital.casalini.it/9781118548356 COLECCIÓN Wiley Series in Probability and Statistics MATERIAS Probabilidades y matemáticas aplicadas Mathematics